Testability Features and the Testability Access of the Alpha 21164 Microprocessor

Testability Features of the Alpha 21364 Microprocessor

The custom testability strategy of the Alpha 21364, Hewlett-Packard’s most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core. Several additional DFT features integrate to meet the testing challenges of the new generation.

Design for Testability

This paper presents an implemented system for modifying digital circuit designs to enhance testability. The key contributions of the work are: (1) setting design for testability in the context of test generation, (2) using failures during test generation to focus on testability problems, (3) indexing from these failures to a set of suggested circuit modifications. This approach does not add tes...

Synchronizing the IEEE 1149.1 Test Access Port for Chip-Level Testability

testability standard in the industry. Although its mandatory provisions focus narrowly on boardlevel assembly verification testing, primarily via the boundary-scan register, its test access port (TAP) and many optional provisions make the standard usable for a much broader range of applications. Since its inception, numerous extensions and applications have been proposed that allow the standard...

Testability Features of the AMD-K6 Microprocessor

A methodolgy for characterizing cell testability

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . vii Acknowledgments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . viii Chapter 1: Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1.1 Designing Testable...